KH5303 SMD Crystal Pi-network In-process Tester ( Pallet Type)

Specifications
Frequency Range	KH1120 : 1 - 12 0 MHz
	KH1240 : 1 - 2 4 0 MHz
Crystal Measurement	Built-in KH1120 / KH1240 Pi-network Crystal Measurement System provides absolute measurement accuracy.
Measurement Method :	High a ccuracy IEC444 -5 and IEC444-6 p i- n etwork crystal m easurement algorithm .
Drive Level :	10nW – 1mW into 25 ohm.
Supported Parameters : F s , F r , FL, R s , R r , RL, CL, C0, C1, L1, Q, Ts, C0/C1, DF1, DF2, DLD, DLD- g , FL1, FL2, Spurious Scan …. Automatic spurious response measurement. Automatic drive level dependenc e (DLD) measurement. Microsoft Windows â operation allows high quality graph and report printout. High speed PASS/FAIL measurements . All parameter limits are individually programmable by operator. User friendly system operation including menu driven, mouse operation and easy system calibration. Flexible data storage and printing features. Optional multi-language software for using in different countries ( Chinese, English, and more ... ).
Repeatability :	Fs £ ± Time base error ± 1 ppm.
	FL £ ± Time base error ± 1 ppm ± (0.2pF ´ Ts of crystal).
	Rs £ ± 8% ± 1 W .
Time Base error :	exfactory calibration £ 1 ppm.
	aging for 1st year £ 2 ppm.
	aging for 2nd year and thereafter £ 1 ppm.
Calibration Method :	With standard resistor ( provided with machine ).
LEGEND Computer (or compatible) with Windows ®98.
Dimensions :	540(W) x 820(D) x 1600(H) (Not include Signal Pole)

Optional
Optional Windows Compatible Printer. KH5602 High Driver Options