KH3020/KH3100 Automatic Quartz Crystal Final Sort System with PI - network Measurement (1-120MHz /1 –240 MHz)

Features

Low Cost, high throughput High speed DLD measurement (10 points DLD measuring time approx. 0.5 sec) Built-in KH1120 or KH1240 High accuracy Network Analyzer subsystem Microsoft Windows â operation allows high quality graph and report printout. Full Network Analyzer Configuration with Built-in Frequency synthesizer and Vector Voltmeter, gives better accuracy and repeatability as compare to other Phase Locked systems. High Accuracy PI-Network Measurement compatible to IEC444 Sorting capability for all crystal parameters 4 sorting bins Numerous User selectable Test Report formats Fully computer controlled : Easy operation with color monitor and full ASCII keyboard

Specifications
Frequency range	1 to 120 MHz (KH3020), 1 to 240 MHz (KH3100)
Measurement throughput	> 5MHz typical 5000 pcs/hr, <>
Measurement Capabilities	Fs, Fr, FL, FL1, FL2, Rs, Rr, RL, CL, C0, C1, L1, Q, Ts, C0/C1, DF1, DF2, DLD, DLD-gamma, Spurious Scan, IR…..
Drive Level	10nW - 1mW into 25 Ohm
Dimensions (WxDxH)	550mmx765mmx1650mm
Weight	180kg

Software Capabilities

Easy to operate full screen editor, and all test parameter limit specifications are stored as "Setup File" in the computer hard disk for easy operation. Setup Files contain the crystal frequency, drive level, and specific crystal parameters to be measured and also specifies how the crystals are sorted into 4 bins. During automatic test mode, the computer displays the measured crystal parameters and the number of crystals in each bin continuously. The software compiles statistical information for the crystals being tested. This information includes mean, standard deviation, and distribution graphs.

Standard System Configuration
KH1120 or KH1240 PI network Crystal measurement subsystem	1 set
LEGEND Computer or IBM compatible Computer with 3.5" floppy, hard disk, Color XGA Monitor, keyboard , Windows 98 or higher	1 unit
System controller and System Operating Software	1 set
Automatic Feeder Bowl for 49U, 49US crystals	1 unit

Options
KM-3900 IR meter Windows compatible printer UM-1/UM5 crystal up-grade kit option

KH5303 SMD Crystal Pi-network In-process Tester ( Pallet Type)

Specifications
Frequency Range	KH1120 : 1 - 12 0 MHz
	KH1240 : 1 - 2 4 0 MHz
Crystal Measurement	Built-in KH1120 / KH1240 Pi-network Crystal Measurement System provides absolute measurement accuracy.
Measurement Method :	High a ccuracy IEC444 -5 and IEC444-6 p i- n etwork crystal m easurement algorithm .
Drive Level :	10nW – 1mW into 25 ohm.
Supported Parameters : F s , F r , FL, R s , R r , RL, CL, C0, C1, L1, Q, Ts, C0/C1, DF1, DF2, DLD, DLD- g , FL1, FL2, Spurious Scan …. Automatic spurious response measurement. Automatic drive level dependenc e (DLD) measurement. Microsoft Windows â operation allows high quality graph and report printout. High speed PASS/FAIL measurements . All parameter limits are individually programmable by operator. User friendly system operation including menu driven, mouse operation and easy system calibration. Flexible data storage and printing features. Optional multi-language software for using in different countries ( Chinese, English, and more ... ).
Repeatability :	Fs £ ± Time base error ± 1 ppm.
	FL £ ± Time base error ± 1 ppm ± (0.2pF ´ Ts of crystal).
	Rs £ ± 8% ± 1 W .
Time Base error :	exfactory calibration £ 1 ppm.
	aging for 1st year £ 2 ppm.
	aging for 2nd year and thereafter £ 1 ppm.
Calibration Method :	With standard resistor ( provided with machine ).
LEGEND Computer (or compatible) with Windows ®98.
Dimensions :	540(W) x 820(D) x 1600(H) (Not include Signal Pole)

Optional
Optional Windows Compatible Printer. KH5602 High Driver Options

KC5102 Pi - network Automatic In-process Crystal Measurement System

KH-5102 Pi - network Automatic In-process Crystal Measurement System

The KH5102 Pi-network Automatic In-process Crystal Measurement System is designed to be used with a final frequency adjustment system, such as Showa Shinku SC-6SA and Kolinker SC-6SA-KH. The semi-finished crystal before and after partial plating ( final frequency adjustment ) process are often prone to foul or break if measured by hand. With KH5102, you can test all crystals automatically right after final frequency adjustment , screen out the bad crystals so as to save welding and aging process time and minimize production loss. The built-in KH1120 / KH1240 Pi-network Crystal Measurement System gives excellent absolute measurement accuracy when compared to other in-process checker. It uses the IEC444-5 and IEC444-6 international standard for crystal measurement. Testing specifications include all crystal parameters such as Fs, FL, Rs, C0, C1, L1, Q, Ts, DLD, DLD-gamma, Spurious Scan … Special DLD measurement algorithm to avoid waking up sleeping crystal. With the LED indicators located by the side of each crystal, the operator can easily figure out which crystal is fail. For detail measurement data, the operator can view on the monitor screen or print the whole report to the printer. Different types of test wheel can be used; common examples are Showa Shinku SC-6SA 49U 72 positions, Kolinker 49U lead-upward 72 positions, and 49S 72/90/144 positions test wheels.

Specifications
Frequency Range	KH1120 : 1 - 12 0 MHz
	KH1240 : 1 - 2 4 0 MHz
Fixture type :	test wheel in 72 and 144 positions changeable.
Crystal Measurement instrument : Built-in KH1120 / KH1240 Pi-network Crystal Measurement System provides absolute measurement accuracy. Crystal Measurement Method : High a ccuracy IEC444 -5 and IEC444-6 p i- n etwork crystal m easurement algorithm .
Drive Level :	10nW – 1mW into 25 ohm.
Supported Parameters : F s , F r , FL, R s , R r , RL, CL, C0, C1, L1, Q, Ts, C0/C1, DF1, DF2, DLD, DLD- g , FL1, FL2, Spurious Scan …. Automatic spurious response measurement. Automatic drive level dependenc e (DLD) measurement. Microsoft Windows â operation allows high quality graph and report printout. High speed PASS/FAIL measurements . All parameter limits are individually programmable by operator. User friendly system operation including menu driven, mouse operation and easy system calibration. Flexible data storage and printing features. Optional multi-language software for using in different countries ( Chinese, English, and more ... ).
Repeatability :	Fs £ ± Time base error ± 1 ppm.
	FL £ ± Time base error ± 1 ppm ± (0.2pF Ts of crystal).
	Rs £ ± 8% ± 1 W.
Time Base error :	exfactory calibration £ 1 ppm.
	aging for 1st year £ 2 ppm.
	aging for 2nd year and thereafter £ 1 ppm.
Calibration Method :	With standard resistor ( provided with machine ).
HP Vectra or LEGEND Computer (or compatible) with 3.5" floppy, hard disk, Color XGA Monitor, keyboard

KG6633 Dual Headπnetwork Final Plating System (Simultaneous plating)

The KG6633 utilizes the latest Proportional- Integral- Differential (PID) plating controlalgorithm enhanced with shutter forecasting control. Intelligent solid-state plating power control module gives better plating accuracy and higher speed compared to the other conventional shutter-only or PID-only control system. Typical plate time per crystal is less than 2 seconds (1) (totally 2 plating cycles), with typical frequency spread of less than ± 5 ppm. The built-in high quality KH1120D / KH1240D Dual channels Pi-network Crystal Measurement System provides the final accuracy of the crystal being plated. Measurement accuracy of less than ± 2 ppm could be achieved (Fs or Fr). And for full frequency range, both Fs and FL can be plated with high accuracy. Vacuum system design utilize traditional style. Therefore providing simple maintenance, easy repairing, and low cost spare parts. The system operation software is user friendly and menu driven. Touch panel is designed for production workers to operate easily, so that they do not need to work with the computer. Specifications Frequency range 1-120MHz (with KH1120D dual channel network analyzer card), or 1-240MHz (with KH1240D dual channel network analyzer card) Plating control algorithm Real time digital PID control, with shutter forecast Filament control Computer controlled real time high speed solid-state SSR Pump down time (4) Approx. 3 minute to 1 x 10 -4 Torr. Plating capacity (2) Computer programmable to 144 or 72 positions. Throughput (2) Around 8 minutes (3) per cycle at 144 positions (monthly capacity of 600K approx.). Power requirement (2) 380Vac 3-phase 50Hz. Approx. 4 KVA. Cooling water required (2) 2 Kgf/cm 2 below 25 oC. Approx. 6 litre/min. Compressed air required (2) 5 Kgf/cm 2 Pumping System (2) Rotary pump and diffusion pump. Vacuum gauge (2) Analogue penning gauge. Standard System Configuration Vacuum Chamber 1 set KH1120D or KH1240D Dual channels network analyzer card 1 set Computer with 1.44M floppy drive, hard disk and color monitor 1 set Filament controller (plating power control) 2 sets Panel controller 1 set Operation system 1 set Standard spare parts 1 set

KG6633 Dual Headπnetwork Final Plating System (Simultaneous plating)

QCM Pro

QCM Pro Crystal Measurement Software

Extend the capabilities of E5100 to high accuracy IEC444 pI-network crystal measurement. Microsoft Windows® 3.1/95/98 operation. Measurement capabilities : Fr, Fs, FL, Rr, Rs, RL, CL, C0, C1, L1, Q, Ts, C0/C1, DF1, DF2, FL1, FL2, DLD, DLD-gamma (IEC444-6 standard), spurious scan. Automatic spurious response and drive level dependence measurement. Extensible measurement head. High speed Pass/Fail measurement and sorting upto 5 bins ( sorting results displayed on screen ). Typical measurement speed for single Fs and FL measurement – 0.8 sec / pc. All sorting limits of each bins are individually programmable by operator. User friendly system operation including menu driven, mouse operation and easy system calibration. Flexible data storage and printing features. Optional multi-languages operating software for using in different countries ( Chinese, English, and more ... ). Calibration Method : with standard resistor ( provided as options ). Operates with National Instruments GPIB interface card (PCI or ISA bus) for communication between computer and E5100. Operates with Hewlett Packard E5100, E5100A or E5100B.

Standard Package
Kolinker crystal measurement software for E5100. Kolinker software protection card (ISA bus).

Optional items to be supplied upon customer request

IBM™ PC compatible computer system with minimum one ISA and one ISA/PCI Slot, Pentium 200MHz or above, 1.44MB floppy drive, 16M RAM, 2GB hard disk, Windows ® 3.1 / 95 / 98 , mouse, 800 x 600 SVGA display adaptor. Printer with Windows ® driver. Hewlett Packard E5100 /A /B Network Analyser. Hewlett Packard and Kolinker test fixtures. National Instruments GPIB Interface Card for ISA bus – model : GPIB-PCIIA (or equivalent). National Instruments GPIB Interface Card for PCI bus – model : PCI-GPIB (or equivalent).

KS300 Desk Top Crystal Sorter

Features

No compressed Air! Delicated design for crystal trader/manufacturer, IQC, sample check High speed DLD measurement (10 points DLD measuring time approx. 0.5 sec) Built-in KH1120 or KH1240 High accuracy Network Analyzer subsystem High Accuracy PI-Network Measurement compatible to IEC444 Sorting capability for all crystal parameters Microsoft Windows® operation allows high quality graph and report printout. No special adjustment for HC-49U and HC-49US crystals (KS300-UM is special version for UM crystals) 2 sorting bins "PASS", "FAIL" Numerous User selectable Test Report formats Fully computer controlled : Easy operation with color monitor and full ASCII keyboard

Specification

Frequency Range : 1 to 120 MHz (KH 1120), 1 to 240 MHz (KH 1240) Measurement throughput : Approx. 5200 pcs/hr* Measurement Capabilities : Fs, Fr, FL, FL1, FL2, Rs, Rr, RL, CL, C0, C1, L1, Q, Ts, C0/C1, DF1, DF2, DLD, DLD-gamma, Spurious Scan, IR….. Drive Level : 10nW - 1mW Power : AC220V, 50Hz Dimensions : 600mm(W) x 500mm(D) x 400mm(H), Main Unit : 250mm(W) x 200mm(D) x 300mm(H) Weight : 35Kg (Main Unit + Feeder Bowl)

Software Capabilities

Easy to operate , full screen editor and all test parameter limit specifications are stored as "Setup File" in the computer hard disk for easy operation. Setup Files contain the crystal frequency, drive level, and specific crystal parameters to be measured and also speci fies how the crystals are sorted into 2 bins During automatic test mode, the computer displays the measured crystal parameters and the number of crystals in each bin continuously. The software compiles statistical information for the crystals being tested. This information includes mean, standard deviation, and distribution graphs. Testing data can be stored and printout.

Standard System Configuration
KH1120 or KH1240 PI network Crystal measurement subsystem 1 set Operation software & cabling 1 set Controller Card 1 set Main Unit 1 set PI Test Head 1 set Sorting Bins 2 sets Automatic Feeder Bowl for 49U, 49US crystals 1 set

Options
Windows compatible printer Legend/IBM Compatible computer with Windows 95/ Windows 98/Windows ME (Pentium III 800MHz or better with Windows 98® is strongly recommended for optimum performance , Full size PCI slot with +3V and +5V is required)

KH1120 / KH1240 PI-Network Crystal Measurment System

High Accuracy IEC444 PI-Network Measurement. Supports "Direct Impedance Measurement" and "Physical Load Capacitance" methods for FL measurement. Microsoft Windows® 95/98/Me operation. Full Network Analyser Configuration with built-in Frequency synthesizer and Vector-voltmeter. Frequency Range : KH1120 : 1-120MHz KH1240 : 20KHz – 400KHz, 500KHz – 240MHz Drive Level : 10nW - 1mW into 25 Ohm. Measurement capabilities (more than 48 parameters): Fr, Fs, FL, Rr, Rs, RL, CL, C0, C1, L1, Q, Ts, C0/C1, DF1, DF2, FL1, FL2, DLD-F, DLD-R, DLD-γ (gamma : IEC444-6 standard), spurious scan. Automatic spurious response measurement. Automatic drive level dependence measurement. Extensible measurement head. Optional test fixture for SMD packages. Optional Test Fixture for Tuning Fork Crystal (For KH1240). Microsoft Windows® operation allows high quality graph and report printout. High speed PASS/FAIL measurement and sorting upto 5 bins ( sorting results displayed on screen ). All sorting limits of each bins are individually programmable by operator. User friendly system operation including menu driven, mouse operation and easy system calibration. Flexible data storage and printing features. Optional multi-language operating software for using in different countries ( Chinese, English, and more ... ). External time base interface. Repeatability : Fs ≤ ± Time base error ± 1 ppm. FL ≤ ± Time base error ± 1 ppm ± (0.2pF × Ts of crystal). Rs ≤ ± 8% ± 1 Ω . Time Base error : exfactory calibration ≤ 1 ppm aging for 1st year ≤ 2 ppm aging for 2nd year and thereafter ≤ 1 ppm Calibration Method : 3 terms (open, short and load) calibration with standard resistor ( provided with system ). Requirements on IBM™ PC compatible computer supplied by user : Minimum Pentium III 300MHz , 3.25” floppy, 64MB RAM, 20M hard disk space , Windows® 95, mouse, 800 x 600 SVGA display adaptor (Pentium III 800MHz or better with Windows 98 is strongly recommended for optimum performance ). Full size PCI slot with +3V and +5V is required